X-Ray Absorption Fine Structure (XAFS) spectroscopy is an important analytical tool at synchrotron radiation facilities. It can reveal information on the local atomic structure and on the chemical valence of the absorbing atom. Due to the high versatility, this method finds applications in physics, chemistry, biology, material, environmental and earth sciences, and even in the study of cultural heritage. Thanks to the penetrating power of X-rays, XAFS allows investigating functional materials under realistic working conditions (e.g. at high temperatures and pressures).

The course is aimed at both beginners and people with basic synchrotron experience and will focus especially on the studies of catalysts and surfaces. Participants will meet leading experts in the field and gain theoretical and practical knowledge to set up ex situ and in situ XAFS measurements and to evaluate the data on their own. Further X-ray techniques available at synchrotron facilities will also be presented. The course is jointly organized by KIT and DESY with financial support from the DFG SPP2080 program. The number of participants is limited to 32 divided in 2 groups (beginners and those with basic synchrotron experience).

Temporary Schedule

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