due to the difficulties we all are facing on account of the Coronavirus situation, the FIB-SEM User Meeting Italy 2020 will be held online with three weekly sessions dedicated to specific topics. In each session we will have large room for round table discussions on the topics presented.
We invite you to join the Sessions that will take place on June 30th, on July 07th and 14th. You can choose to attend to just one or more sessions.
Focused Ion Beam (FIB) combined with Field Emission Scanning Electron Microscope (FE-SEM) has become powerful instruments for numerous applications in research and industry. This technology is now the standard for cross-sectioning, nanoscale tomographic imaging and creation of new materials or functional structures with superior properties through etching, deposition and lithography. FIB-SEM applications are complex workflows that combine the capabilities of the FIB with other components like detectors, manipulators and gas injection systems (GIS).
The entire meeting will be held in English.