Virtual FIB-SEM User Meeting Italy 2020

Dear Customer,

due to the difficulties we all are facing on account of the Coronavirus situation, the FIB-SEM User Meeting Italy 2020 will be held online with three weekly sessions dedicated to specific topics. In each session we will have large room for round table discussions on the topics presented.

We invite you to join the Sessions that will take place on June 30th, on July 07th and 14th. You can choose to attend to just one or more sessions.

Focused Ion Beam (FIB) combined with Field Emission Scanning Electron Microscope (FE-SEM) has become powerful instruments for numerous applications in research and industry. This technology is now the standard for cross-sectioning, nanoscale tomographic imaging and creation of new materials or functional structures with superior properties through etching, deposition and lithography. FIB-SEM applications are complex workflows that combine the capabilities of the FIB with other components like detectors, manipulators and gas injection systems (GIS).

The entire meeting will be held in English.

Imaging and Sample Preparation Day

FIB-SEM allow to obtain morphological, compositional and analytical information from the surface, and cut cross-sections to image beneath the sample surface at the highest resolution. Moreover, this is the perfect tools to prepare specimens for other microscopic techniques such as TEM or STEM. 

Session 1 – Tuesday June 30th 2020

10.00 a.m. – 12.00 p.m. (CEST)

10.00 Welcome and presentation of the program Vittorio Morandi (CNR-IMM)      Giulio Lamedica (ZEISS Microscopy)
10.10 Integrated TOF-SIMS in FIB-SEM: case studies Antonio Casares (ZEISS Microscopy)
10.35 Virtual Round table TOF-SIMS and analytics All
10.50 New perspectives in TEM Lamella preparation: case studies and practical example Fabián Pérez Willard (ZEISS Microscopy)
11.10 Virtual round table TEM Lamella preparation All
11.20 Low-kV scanning electron microscopy – beyond sample topography Iwona Jóźwik (Łukasiewicz Institute of Electronic Materials Technology)
11.50 Virtual round table Low-kV imaging All
12.00 End of the session  

Nanofabrication Day

Creation of nanostructures and nanodevices using a focused ion beam is widely used in materials research and electronics. It allows the creation of new functional materials or surfaces with superior optical, mechanical, electronic or magnetic properties. In this session we will explore these applications to highlight the future development and the constraints encountered in this field.

Session 2 – Tuesday 7th July

10:00 a.m.- 12.00 p.m. (CEST)

10.00 Focused Ion Beam (FIB) and Focused Electron Beam Induced Deposition (FEBID) for advanced nanocharacterization and nanofabrication Giancarlo Gazzadi (CNR Istituto Nanoscienze)
10.25 Virtual round table FIBID and FEBID All
10.40 Nanostructures growth through Induced deposition Massimo Cuscunà (CNR NANOTEC)
11.05 Virtual round table FIBID and FEBID (II) All
11.20 FEG-SEM as a flexible and smart tool for R&D nanolithography Pasqualantonio Pingue (NEST)
11.45 Virtual round table nanolithography All
12.00 End of Session  

3D Electron and Ion Microscopy Day

Tomography fully opens the third dimension to scanning electron microscopy. It allows to image and analyze not only a single plane, but a complete volume of a sample down to the nanometer scale.
In this session we will explore different nanotomography methods from Correlative 3D Imaging to FIB-SEM, Cryo FIB-SEM and STEM.

Session 3 – Tuesday July 14th

10.00 a.m. -12.00 p.m. (CEST)

10.00 Transmission imaging and tomography in the SEM platform Matteo Ferroni (Università degli Studi di Brescia – CNR IMM)
10.25 Virtual round table STEM Tomography All
10.40 Multi-scale correlative imaging: geological, biological and materials applications Ria Mitchell (Faculty of Engineering, The University of Sheffield, UK)
11.05 Virtual round table Multi-scale Microscopy All
11.20 Cryo Correlative Workflows from Confocal Microscopy to FIB-SEM Andreas Schertel (ZEISS Microscopy)
11.45 Virtual round table Cryo Microscopy All
12.00 End of session
By | 2020-06-25T09:46:25+00:00 June 25th, 2020|Конференции|0 Comments