Multilayer optical properties: modeling and curve-fitting IDL package written by David Windt.
- Sergey’s X-Ray Library
Web based calculations of scattering factors for dynamical x-ray diffraction and simulations of dynamical x-ray diffraction profiles from strained crystals and multilayers. Authored by Sergey Stepanov at the Advanced Photon Source.
- Stony Brook IDL Routines
IDL routines which calculate the complex index of refraction for a material from the atomic scattering factors. The output of these routines may be then used in the calculation of other quantities such as the transmission of a filter, etc. A routine to calculate reflectivity is also available. Written by Chris Jacobsen.
XOP is a widget based interface which drives different programs that calculates the synchrotron radiation source spectra (bending magnet, wigglers and undulators) and the reflection and transmission characteristics of optical elements as: mirror, filters, flat crystals, bent perfect crystals, and multilayers. XOP is the result of a collaboration work between Manuel Sanchez del Rio (ESRF) and Roger J. Dejus (APS).