History and scope
XTOP 2014 poster The first XTOP conference (“ X-Ray Topography and High Resolution Diffraction ”) took place in Marseille in 1992. The original topics covered were topography, double- and triple-crystal diffractometry of epitaxial layers, reflectometry and standing waves technique, with other added at later meetings. Topics for XTOP ‘2014 hold to the traditions of all the previous conferences.
XTOP brings together scientists from the fields of X-ray diffractometry, reflectometry, standing waves, coherent and conventional X-ray diffraction imaging and topography, as well as X-ray phase contrast imaging (radiography and micro- tomography). XTOP is thus one of the central scientific conference concerning methods and instrumentation in synchrotron-based high-resolution X-ray diffraction methods, phase contrast imaging, and micro-tomography.
Invited Speakers :
- André Authier (Univ. Pierre & Marie Curie, Paris) Early Days of X-ray Diffraction and the Birth of the Dynamical Theory
- Anton Barty (DESY) Serial crystallography with X-ray free electron lasers
- Dina Carbone (Max IV) X-ray Nanobeams : a great tool for nanoscience
- Peter Cloetens (ESRF) X-ray nano-tomography through nano-focusing
- Ana Diaz (Swiss Light Source) X-ray ptychography: from technique development to applications
- Johan Gustafson (Lund Univ.) High-energy surface X-ray diffraction applied to model catalysis
- Martin Holt (Argonne National Lab.) Strain Imaging of Nanoscale Semiconductor Heterostructures with X-ray Bragg Projection Ptychography
- Christoph Kirchlechner (MPI Düsseldorf) In situ micromechanics: An overview on µLaue based experiments
- Erik Lauridsen (Denmark) Diffraction Contrast Tomography on a 3-D Laboratory X-ray Microscope
- Alessandro Olivo (University College London) Current state of development and future perspectives of edge-illumination
- Paul Tafforeau (ESRF) Phase contrast imaging of fossils: how synchrotrons revolutionized palaeontology
- Maria Tsoutsouva (ESRF) Defect characterisation of ‘mono-like’ silicon for photovoltaic applications using quantitative X-ray diffraction imagin
- Thomas van de Kamp (KIT) Time-resolved in vivo tomography for tracking morphological dynamics
Speakers from Science and Education Centre “Functional nanomaterials” Innovation park of Immanuel Kant Baltic Federal University:
1. S. Medvedeva, A. Goikhman, I. Lyatun, P. Ershov, I. Snigireva, A.Snigirev, “Use of hard X-ray microscopy to study multilayer structures”
2. I. Lyatun, A. Goikhman, P. Ershov, I. Snigireva, A. Snigirev, “Influence of Internal Material Structure on Optical Propertie of Be Refractive Lenses”
Докладчики:
- “Use of hard X-ray microscopy to study multilayer structures” («Использование рентгеновской микроскопии для изучения многослойных структур»)
- “Influence of Internal Material Structure on Optical Propertie of Be Refractive Lenses” (“Влияние внутренней структуры материала на оптические свойства бериллиевых преломляющих линз”)
Место проведения: 14-19 september, Vilard de Lans, France
Ссылка: http://xtop2014.org/
