International Conference on X-ray optics, detectors, sources, and their applications 2016 (XOPT’16)

We are pleased to announce the inauguration of the International Conference on X-ray Optics, Detectors, Sources, and their Applications (XOPT`16) as part of the Optics and Photonics International Congress 2016 (OPIC2016) in Yokohama, Japan.

X-rays have facilitated a number of key scientific discoveries in recent years. Continuous technological breakthroughs in X-ray sources, optics, and detectors have laid the foundation for these achievements. For this conference, we are inviting leading experts in these fields from around the world to exchange the latest status of the developments, and to discuss the future. We believe it is appropriate to host this conference in Japan, as the Japanese scientific community has contributed significantly to the development of state-of-the-art X-ray optical technologies over the last fifty years.

Место проведения:  18 – 20 May,2016 Japan, Yokohama

Ссылка:  http://opic-opic.sakura.ne.jp/xopt/

 

Conference Chairs
Tetsuya Ishikawa & Kazuto Yamauchi

Sponsor and support
RIKEN SPring-8 Center
Osaka University Research Center for Ultra-Precision Science and Technology
Important date
Abstract submission: 8 Feb.2016 , Monday(Extended)
Early Registration: April 15, 2016, Friday

Welcome
We are pleased to announce the inauguration of the International Conference on X-ray Optics, Detectors, Sources, and their Applications (XOPT`16) as part of the Optics and Photonics International Congress 2016 (OPIC2016) in Yokohama, Japan.
X-rays have facilitated a number of key scientific discoveries in recent years. Continuous technological breakthroughs in X-ray sources, optics, and detectors have laid the foundation for these achievements. For this conference, we are inviting leading experts in these fields from around the world to exchange the latest status of the developments, and to discuss the future. We believe it is appropriate to host this conference in Japan, as the Japanese scientific community has contributed significantly to the development of state-of-the-art X-ray optical technologies over the last fifty years.
We are happy to welcome you to participate in and enjoy the Conference.

Scope
XOPT covers the recent progress of X-ray science and technology with topics including the following fields:


X-ray optical components

  • High-resolution monochromators
  • High-resolution spectrometers/analyzers
  • Beamline monochromators/mirrors
  • Focusing optics (reflective, refractive, diffractive)
  • Phase retarders and polarization optics
  • Diagnostics tools (intensity/spatial/spectral/temporal/coherence/wavefront)
X-ray sources

  • Synchrotron radiation sources
  • Free electron lasers
  • High-order harmonic generation (HHG) sources
X-ray Detectors

  • Imaging Detectors
  • Spectroscopic detector
  • Superconducting detector
Methods/applications
 

  • X-ray imaging/microscopy
  • X-ray inelastic scattering
  • Time resolved analysis
  • X-ray correlation spectroscopy
  • Nonlinear X-ray optics

 

Sponsors:

 

Место проведения: 18 – 20 May,2016 Japan, Yokohama
Ссылка: http://opic-opic.sakura.ne.jp/xopt/

Программа

Call for papers

 

Наши доклады:

  1. A. Snigirev, «20 years of X-ray refractive optics. New promising prospectives for diffraction limited X-ray sources», Invited Speaker, International conference on X-ray optics, detectors, sources and their applications, 18-20 May, Yokohama, Japan
  2. I. Snigireva, A. Snigirev, “Coherent high energy microscopy for the characterization of mesoscopic materials, oral presentation XOPT4-3, International conference on X-ray optics, detectors, sources and their applications (XOPT), 18-20 May 2016, Yokohama, Japan
  3. P. Ershov, S. Kuznetsov, I. Snigireva, V. Yunkin, A. Snigirev, “X-ray diffractometry based on refractive optics”, poster XOPTp8-18, International conference on X-ray optics, detectors, sources and their applications (XOPT), 18-20 May 2016, Yokohama, Japan
  4. M. Lyubomirskiy, I. Snigireva, S. Kuznetsov, V. Yunkin, V. Kohn, A. Snigirev, “Hard X-ray in-line interferometers fabricated by Si planar technologies”, poster XOPTp8-19, International conference on X-ray optics, detectors, sources and their applications (XOPT), 18-20 May 2016, Yokohama, Japan
  5. A. Narikovich, I. Lyatun, D. Zverev, S. Savelyev, I. Snigireva, A. Snigirev «Metrology of parabolic profile X-ray refractive lens», book of abstracts “International Conference on X-ray optics, detectors, sources, and their applications”,  18-20 May, Yokohama, Japan
  6. D. Serebrennikov, E. Clementyev, A. Snigirev «Optimization of the optical performance of coumpound refractiveX-ray lenses » book of abstracts “International Conference on X-ray optics, detectors, sources, and their applications”, 18-20 May, Yokohama, Japan
  7. M.V. Polikarpov, S.A. Terentiev, S.N. Polyakov, S.I. Zholudev , V.A. Yunkin, I.I. Snigireva, V.D. Blank and A.A. Snigirev, «Diamond refractive lenses as the breakthrough optic tool for high heat flux X-ray beams», book of abstracts “International Conference on X-ray optics, detectors, sources, and their applications”, 18-20 May, Yokohama, Japan
  8. I. Lyatun, P. Ershov, A. Goikhman, I. Snigireva, A. Snigirev «The influence of beryllium microstructure on the compound refractive lenses optical properties in X-ray microscopy», book of abstracts “International Conference on X-ray optics, detectors, sources, and their applications”, 18-20 May, Yokohama, Japan